Events

Jun
20
Thu
Ottawa IEEE Lunch and Learn on state of the Canadian Internet @ CENGN (Center for Next Generation Networks)
Jun 20 @ 11:30 – 13:00

Status of the Internet in Canada and the importance of Canadian IXP’s

Jacques Latour

Chief Technology Officer, CIRA/.CA

A quick overview of the Canadian Internet exchange landscape from coast to coast to coast. Canada has its share of challenges and opportunities in building and growing the IXP infrastructure near the Canadian border, and also to support the need of the rural communities.

As an expert in developing innovative, leading-edge IT solutions, Jacques has established CIRA as a global leader among ccTLD registries. He has 25+ years of experience in the private and not-for-profit sectors and as CIRA’s CTO,is currently leading CIRA Labs, CIRA’s innovation hub and providing leadership and direction for the management and security of the .CA registry and its underlying DNS.

A visionary in the Internet community, Jacques led the development of CIRA’s Internet Performance Test, is an outspoken advocate for the adoption of IPv6 and represents the .CA registry internationally as a member of a variety of working groups and advisory groups, including being a member of ICANN’s Security and Stability Advisory Committee (SSAC), TLDOPS standing committees and TechDay and DNSSEC Planning Program Committee.

Jacques is committed to the development of a new Canadian Internet architecture. He has served as the catalyst for the creation of a national Canadian IXP association, CA-IX, and is a member of the Manitoba Internet Exchange’s (MBIX) and the DNS-OARC Board of Directors.

Jacques holds an Electronics Engineering Technologist diploma from Algonquin College in Ottawa, is ITIL v3 Foundation certified and is a certified Agile ScrumMaster.

Agenda

11:30 – 12:00  Lite Lunch, Networking, and Welcoming Remarks
12:00 – 13:00  Seminar

Sep
2
Wed
Characterization and Modeling of GaN HEMT Trapping Effects for Microwave Circuit Design
Sep 2 @ 11:00 – 12:00

 

IEEE Ottawa Section: MTT-S / AP-S Chapter presents:

Title: Characterization and Modeling of GaN HEMT Trapping Effects for Microwave Circuit Design

Date: September 2nd, 2020

Time: 11 AM (ET)

Register at: https://events.vtools.ieee.org/m/238482

This talk will review some recent advancements achieved on the characterization and modelling of the trapping effects felt in GaN HEMT transistors, and their impact on microwave circuit design. Because of their nowadays importance, a particular attention will be payed to applications on high power amplifiers for mobile wireless infrastructure and pulsed radar applications.

For that, the talk will start by recollecting the most common model formulations adopted for the various levels of RF engineering, from the device level (physics) to the transistor (circuit) and amplifier (system) level. Starting by the Shockley-Read-Hall capture and emission processes we will be able to understand one of the fundamental signatures of trapping effects, the significantly different charge and discharging time constants, and its impact on power amplifier nonlinear distortion behavior. Then, some widely adopted approaches of the channel current transients’ characterization are addressed and the talk concludes by presenting some illustrative cases of application to RF high power amplifiers.

Speaker: Jose C. Pedro

José C. Pedro received the Diploma, Ph.D., and Habilitation degrees in electronics and telecommunications engineering from the Universidade de Aveiro, Aveiro, Portugal, in 1985, 1993, and 2002, respectively.

He is currently a Full Professor with the Universidade de Aveiro and head of the Aveiro site of the Instituto de Telecomunicações. He has authored 2 books and authored or co-authored more than 200 papers in international journals and symposia. His current research interests include active device modelling and the analysis and design of various nonlinear microwave circuits.

Dr. Pedro was a recipient of various prizes including the 1993 Marconi Young Scientist Award, the 2000 Institution of Electrical Engineers Measurement Prize, the 2015 EuMC Best Paper Microwave Prize, and the Microwave Distinguished Educator Award. He has served the scientific community as a Reviewer and an Editor for several conferences and journals, namely, the IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, for which he was the Editor-in-Chief.

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