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Arduinos, 3D printing, Lego Mindstorms and displays, submarine
robots, and AI, where can you find all this? All of this and MUCH MORE will be at the IEEE Ottawa Robotics
Competition (ORC), Ottawa’s largest robotics competition for grade 5 to 12
students. The ORC is taking place on Sunday,
June 2nd at Earl of March
Secondary School. Best times to show up are between 10:30 am to 12:30 pm and 1:30 pm to 4 pm. The ORC is completely
open to the public, so invite your friends and family too!
Check out previous competitions at https://youtube.com/user/ieeeorc/videos.
If you have any questions, please feel free to email us at orcinfo@ieeeottawa.ca.
Speaker 1: Hisham Abed, P.Eng., Ericsson
Topic:Â Power Integrity – Best design practices
Speaker 2: Dr. Ihsan Erdin, Celestica
Topic:Â Power Integrity Optimization amidst MLCC shortage
Parking:Â Free
Registration: Free, and is on a first to reply basis. Preference given to IEEE EMC and CPMT society members. Seating is limited. E-mail reservation is required.
Pizza and soft drinks will be served.
Organizer: Dr. Syed Bokhari, Chairman, IEEE Ottawa
EMC chapter
Syed.Bokhari@fidus.com,
Office :(613) 595 – 0507 Ext. 377, Cell: (613) 355 – 6632
Directions:Â Â Â www.fidus.com
Ottawa Life Member Affinity Group presents:Â Ottawa L5, the first integrated Connected & Autonomous Vehicle (CAV) test environment in North America.
The Ottawa L5 private test track is a 1,866 acre, fenced and gated private facility with 16 kilometres of paved roads. The largest secure test facility for CAVs in Canada, the Ottawa L5 private test track creates an ideal proving ground for the safe and productive pre-commercial development, testing, validation and demonstration of CAV technologies. The Ottawa L5 testing facilities are equipped with GPS (RTK), dedicated short range communications (DSRC), Wi-Fi, 4G/LTE and 5G telecommunications and networking infrastructure, making it the first integrated CAV test environment of its kind in North America. Find more information at:Â https://www.investottawa.ca/ottawal5
Tour will last about an hour involving a walk around the site and a group discussion of various technical aspects of the L5 facility. An additional treat is the possibility of an autonomous shuttle ride at the site for some attendees.
Please register in advance with wolfram.lunscher@ieee.org by Friday October 11. Priority will be given to Life members. All members and family are welcome. There is an online liability waiver to be signed. The link will be provided to registrants.
IEEEÂ Distinguished Lecturer Presentation hosted jointly by the IEEE Ottawa EMC and CASS/SSCS/EDS Chapters:
Speaker :   Dr. Marcos Rubinstein, Professor, University of Applied Sciences of Western Switzerland
Topic  :   The Lightning Phenomenon
Date   :   Tuesday October 22, 2019
Time   :   12(noon) – 1pm
Location :Â Â Â 4124-ME (Meckenzie Building), Carleton University, 1125 Colonel By Drive, Ottawa – K1S5B6
Registration:Â Free, Please E-mail Ram Achar (achar@doe.carleton.ca)
Refreshments: Served
Parking : Payment based Metered Parking spots in the campus
Organizers:
        Ram Achar, Dept. of Electronics, Carleton University
        Chairman CASS/SSCS/EDS Chapters
        achar@doe.carleton.ca
        Dr. Syed Bokhari, Chairman, IEEE Ottawa EMC chapter
Abstract
Lightning is one of the primary causes of damage and malfunction of telecommunication and power networks and one of the leading causes of weather-related deaths and injuries.
Lightning is composed of numerous physical processes, of which only a few are visible to the naked eye.
This lecture presents various aspects of the lightning phenomenon, its main processes and the technologies that have been developed to assess the parameters that are important for engineering and scientific applications. These parameters include the channel-base current and its associated electromagnetic fields.
The measurement techniques for these parameters are intrinsically difficult due to the randomness of the phenomenon and to the harsh electromagnetic environment created by the lightning itself.
Besides the measurement of the lightning parameters, warning and insurance applications require the real-time detection and location of the lightning strike point. The main classical and emerging lightning detection and location techniques, including those used in currently available commercial lightning location systems will be described in the lecture. The newly proposed Electromagnetic Time Reversal technique, which has the potential to revolutionize lightning location will also be presented.
Biography
Marcos Rubinstein received the Master’s and Ph.D. degrees in electrical engineering from the University of Florida, Gainesville.
In the decade of the 1990’s, he worked as a research engineer at the Swiss Federal Institute of Technology, Lausanne and as a program manager at Swisscom in the areas of electromagnetic compatibility and lightning. Since 2001, he is a professor at the University of Applied Sciences of Western Switzerland HES-SO, Yverdon-les-Bains, where he is currently responsible for the advanced Communication Technologies Group. He is the author or coauthor of 300 scientific publications in reviewed journals and international conferences. He is also the coauthor of nine book chapters and the co-editor of a book on time reversal. He served as the Editor-in-Chief of the Open Atmospheric Science Journal, and currently serves as an Associate Editor of the IEEE Transactions on EMC.
Prof. Rubinstein received the best Master’s Thesis award from the University of Florida, the IEEE achievement award and he is a co-recipient of the NASA’s Recognition for Innovative Technological Work award. He also received the ICLP Karl Berger award. He is a Fellow of the IEEE and an EMP Fellow, a member of the Swiss Academy of Sciences and of the International Union of Radio Science.
IEEE Ottawa Section: MTT-S / AP-S Chapter presents:
Title: Characterization and Modeling of GaN HEMT Trapping Effects for Microwave Circuit Design
Date: September 2nd, 2020
Time: 11 AM (ET)
Register at: https://events.vtools.ieee.org/m/238482
This talk will review some recent advancements achieved on the characterization and modelling of the trapping effects felt in GaN HEMT transistors, and their impact on microwave circuit design. Because of their nowadays importance, a particular attention will be payed to applications on high power amplifiers for mobile wireless infrastructure and pulsed radar applications.
For that, the talk will start by recollecting the most common model formulations adopted for the various levels of RF engineering, from the device level (physics) to the transistor (circuit) and amplifier (system) level. Starting by the Shockley-Read-Hall capture and emission processes we will be able to understand one of the fundamental signatures of trapping effects, the significantly different charge and discharging time constants, and its impact on power amplifier nonlinear distortion behavior. Then, some widely adopted approaches of the channel current transients’ characterization are addressed and the talk concludes by presenting some illustrative cases of application to RF high power amplifiers.
Speaker: Jose C. Pedro
José C. Pedro received the Diploma, Ph.D., and Habilitation degrees in electronics and telecommunications engineering from the Universidade de Aveiro, Aveiro, Portugal, in 1985, 1993, and 2002, respectively.
He is currently a Full Professor with the Universidade de Aveiro and head of the Aveiro site of the Instituto de Telecomunicações. He has authored 2 books and authored or co-authored more than 200 papers in international journals and symposia. His current research interests include active device modelling and the analysis and design of various nonlinear microwave circuits.
Dr. Pedro was a recipient of various prizes including the 1993 Marconi Young Scientist Award, the 2000 Institution of Electrical Engineers Measurement Prize, the 2015 EuMC Best Paper Microwave Prize, and the Microwave Distinguished Educator Award. He has served the scientific community as a Reviewer and an Editor for several conferences and journals, namely, the IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, for which he was the Editor-in-Chief.
