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| 8:30 am – 9:00 am | Registration | ||
|---|---|---|---|
| 9:00 am – 9:15 am | Opening Remarks | Rafik Goubran | Carleton University |
| 9:15 am – 10:00 am | Keynote Presentation:
Data Mining and Machine Learning for Authorship and Malware Analyses |
Benjamin C. M. Fung Biography |
McGill University |
| 10:00 am – 10:30 am | Break | ||
| 10:30 am – 11:45 am | Cybersecurity: Top 5 class imbalance ML challenges and data sets Abstract |
Stephan Jou Biography |
Interset |
| Class Imbalance in Fraud Detection Abstract |
Robin Grosset Biography |
MindBridge Analytics Inc. | |
| Handling class imbalance in natural language processing Abstract |
Isuru Gunasekara Biography |
IMRSV Data Labs | |
| 11:45 am – 12:45 pm | Lunch | ||
| 12:30 pm – 2:10 pm | Adaptive learning with class imbalanced streams Abstract |
Herna L. Viktor Biography |
University of Ottawa |
| Radar-based fall monitoring using deep learning Abstract |
Hamidreza Sadreazami Biography |
McGill University | |
| Privacy-preserving data augmentation in medical text analysis Abstract |
Isar Nejadgholi Biography |
National Research Council | |
| Failure modelling of a propulsion subsystem: unsupervised and semi-supervised approaches to anomaly detection Abstract |
Julio J. Valdés Biography |
National Research Council | |
| 2:10 pm – 2:25 pm | Break | ||
| 2:25 pm – 3:40 pm | TBD | Reddy Nellipudi | DB Schenker |
| AuditMap.ai: Hierarchical Sentence Classification in Unstructured Audit Reports Abstract |
Daniel Shapiro Biography |
Lemay.ai | |
| Deep Learning techniques for unsupervised anomaly detection Abstract |
Dušan Sovilj Biography |
RANK Software Inc. | |
| 3:40 pm – 3:50 pm | Closing Remarks |
Abstract – Application of power electronics is widespread in everyday
life. Some applications are considered as “nice to have it;†in other cases,
they are essential. This presentation discusses a wide variety of daily-used
applications around the world. Also covered is an advanced topic, such as SMART
Controller that today’s grid requires for voltage regulation, power factor
regulation, unbalance voltage/current regulation, harmonic elimination and so
on. A SMART Controller that is based on functional requirements and
cost-effective solutions is derived from utilizing the best features of all the
technical concepts that are developed until now. Final year students of
electrical engineering undergraduate curriculum, post graduate students,
researchers, academicians and utility engineers will benefit from attending
this course. The participants will hear from an expert who actually designed
and commissioned a few utility-grade SMART controllers since their inception in
the 1990s.
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Speaker’s
Bio
Kalyan Sen, a
Fulbright Scholar, is the Chief Technology Officer of Sen Engineering
Solutions, Inc. (www.sentransformer.com) that specializes in
developing SMART power flow controllers—a functional requirements-based and
cost-effective solution. He received
BEE,
MSEE, and PhD degrees, all in Electrical Engineering, from Jadavpur University,
India, Tuskegee University, USA, and Worcester Polytechnic Institute, USA,
respectively. He also received an MBA from Robert Morris University, USA.
Â
Dr.
Sen spent more than 30 years in academia and industry and became a Westinghouse
Fellow Engineer. He was a key member of the Flexible Alternating Current
Transmission Systems (FACTS) development team at the Westinghouse Science &
Technology Center in Pittsburgh. He contributed in all aspects (conception,
simulation, design, and commissioning) of FACTS projects at Westinghouse. He
conceived some of the basic concepts in FACTS technology. He has authored or
coauthored more than 25 peer-reviewed publications, 8 issued patents, a book
and 4 book chapters in the areas of FACTS and power electronics. He is the
coauthor of the book titled, Introduction
to FACTS Controllers: Theory, Modeling, and Applications, IEEE Press and
John Wiley & Sons, Inc. 2009, which is also published in Chinese and Indian
paperback editions. He is the co-inventor of Sen Transformer.
IEEE Ottawa Section: MTT-S / AP-S Chapter presents:
Title: Characterization and Modeling of GaN HEMT Trapping Effects for Microwave Circuit Design
Date: September 2nd, 2020
Time: 11 AM (ET)
Register at: https://events.vtools.ieee.org/m/238482
This talk will review some recent advancements achieved on the characterization and modelling of the trapping effects felt in GaN HEMT transistors, and their impact on microwave circuit design. Because of their nowadays importance, a particular attention will be payed to applications on high power amplifiers for mobile wireless infrastructure and pulsed radar applications.
For that, the talk will start by recollecting the most common model formulations adopted for the various levels of RF engineering, from the device level (physics) to the transistor (circuit) and amplifier (system) level. Starting by the Shockley-Read-Hall capture and emission processes we will be able to understand one of the fundamental signatures of trapping effects, the significantly different charge and discharging time constants, and its impact on power amplifier nonlinear distortion behavior. Then, some widely adopted approaches of the channel current transients’ characterization are addressed and the talk concludes by presenting some illustrative cases of application to RF high power amplifiers.
Speaker: Jose C. Pedro
José C. Pedro received the Diploma, Ph.D., and Habilitation degrees in electronics and telecommunications engineering from the Universidade de Aveiro, Aveiro, Portugal, in 1985, 1993, and 2002, respectively.
He is currently a Full Professor with the Universidade de Aveiro and head of the Aveiro site of the Instituto de Telecomunicações. He has authored 2 books and authored or co-authored more than 200 papers in international journals and symposia. His current research interests include active device modelling and the analysis and design of various nonlinear microwave circuits.
Dr. Pedro was a recipient of various prizes including the 1993 Marconi Young Scientist Award, the 2000 Institution of Electrical Engineers Measurement Prize, the 2015 EuMC Best Paper Microwave Prize, and the Microwave Distinguished Educator Award. He has served the scientific community as a Reviewer and an Editor for several conferences and journals, namely, the IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, for which he was the Editor-in-Chief.
Date and Place: The event will be held online on September 26th and 27th, 2020.
“Every accomplishment starts with the decision to try†~ John F. Kennedy
What?
New to Hackathons? Are you also interested in participating in IEEEXtreme 14.0? IEEE WIE Ottawa presents the first ever Mock Hackathon in Ottawa! Win Exciting Prizes and get experience with us. No need to think of an idea! The questions will be given to you. Our mentors will further help you to get a head start in your hackathon journey! This is a practice event just for you! Learn more about IEEEXtreme here-> https://ieeextreme.org/
When?
September 26th and 27th, 2020
Where?
The event is fully online including the mentorship*.
Agenda
September 26th, 2020
01:00 PM The opening ceremony
02:00 PM Commencement of Hackathon
05:00 PM Final Submission
September 27th, 2020
01:00 PM Results declaration webinar
01:30 PM Prize announcement
02:00 PM The closing ceremony
For More Details Visit: https://wie.ieeeottawa.ca/hack613-the-ottawa-hackathon/
Online Talk: From bees to Drones: Exploring bio-inspired machine vision applications for precision agriculture
Bees are used as vectors for pollination and transport of agricultural chemicals in outdoor agriculture and greenhouses. However, in certain situations the use of natural pollinators is problematic. Small unmanned aerial vehicles (UAVs) could serve as an alternate pollination vector in such situations and perform other functions. A step towards the deployment of such a tool is to bring the ability to locate, classify, and analyze flowers aboard a drone.
More info and registration: https://wie.ieeeottawa.ca/event/from-bees-to-drones-exploring-bio-inspired-machine-vision-applications-for-precision-agriculture/.
A presentation by IEEE WIE Ottawa.
