Events

Jul
7
Tue
A Novel Maximum Power Point Tracking (MPPT) Technique for Photovoltaic Solar Panels
Jul 7 @ 18:00 – 19:30
A Novel Maximum Power Point Tracking (MPPT) Technique for Photovoltaic Solar Panels

The IEEE Reliability Society & Power Electronics
Society is inviting all interested IEEE members and prospective members to a
webinar

 

A Novel Maximum Power Point Tracking (MPPT) Technique for Photovoltaic Solar Panels

By

 

Mahdi Ranjbar

DATE:       July 7, 2020

TIME:        18 19:30.

       

A
novel Maximum Power Point Tracking (MPPT) technique for photovoltaic (PV)
solar panels will be presented.  Current
sensors are costly components. They also require a signal conditioning
circuitry to reduce the noise and condition the signal to be sampled and used
by the controller.  Th
is
method takes advantage of the non-linearity of the I-V curve of the solar panel
to
find the MPP
. By injecting high-frequency perturbation signals and
monitoring the system behavior current sensing used for controlling of MPPT
is eliminated. This elimination can reduce the cost of MPPT circuitry. The proposed method also shows a very fast tracking response due to the use of high-frequency signals instead of relying on low frequency and DC signals which are used in the traditional methods. Numerical analysis, simulation results, and experimental results verify the feasibility of the proposed technique will be shown.

 

Mahdi
Tude Ranjbar received his bachelor’s degree from the University of Tehran,
Iran (2017). In this period, his main focus was on collaboration with different laboratories in ECE and Mechanical engineering departments. He started his M.A.Sc degree in 2018 at Queen’s, Canada with a focus on improving the efficiency of the solar system power generation techniques.  Since March 2020, Mr. Ranjbar has joined the System
Architecture group at HUADA Semiconductors where his main focus is designing power applications using Huada’s microcontrollers, gate drivers and current sense amplifiers.


Please
register here:
 https://events.vtools.ieee.org/tego_/event/manage/233724

A link will be sent to you a day before the event.

 

Sep
2
Wed
Characterization and Modeling of GaN HEMT Trapping Effects for Microwave Circuit Design
Sep 2 @ 11:00 – 12:00

 

IEEE Ottawa Section: MTT-S / AP-S Chapter presents:

Title: Characterization and Modeling of GaN HEMT Trapping Effects for Microwave Circuit Design

Date: September 2nd, 2020

Time: 11 AM (ET)

Register at: https://events.vtools.ieee.org/m/238482

This talk will review some recent advancements achieved on the characterization and modelling of the trapping effects felt in GaN HEMT transistors, and their impact on microwave circuit design. Because of their nowadays importance, a particular attention will be payed to applications on high power amplifiers for mobile wireless infrastructure and pulsed radar applications.

For that, the talk will start by recollecting the most common model formulations adopted for the various levels of RF engineering, from the device level (physics) to the transistor (circuit) and amplifier (system) level. Starting by the Shockley-Read-Hall capture and emission processes we will be able to understand one of the fundamental signatures of trapping effects, the significantly different charge and discharging time constants, and its impact on power amplifier nonlinear distortion behavior. Then, some widely adopted approaches of the channel current transients’ characterization are addressed and the talk concludes by presenting some illustrative cases of application to RF high power amplifiers.

Speaker: Jose C. Pedro

José C. Pedro received the Diploma, Ph.D., and Habilitation degrees in electronics and telecommunications engineering from the Universidade de Aveiro, Aveiro, Portugal, in 1985, 1993, and 2002, respectively.

He is currently a Full Professor with the Universidade de Aveiro and head of the Aveiro site of the Instituto de Telecomunicações. He has authored 2 books and authored or co-authored more than 200 papers in international journals and symposia. His current research interests include active device modelling and the analysis and design of various nonlinear microwave circuits.

Dr. Pedro was a recipient of various prizes including the 1993 Marconi Young Scientist Award, the 2000 Institution of Electrical Engineers Measurement Prize, the 2015 EuMC Best Paper Microwave Prize, and the Microwave Distinguished Educator Award. He has served the scientific community as a Reviewer and an Editor for several conferences and journals, namely, the IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, for which he was the Editor-in-Chief.

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