Join AP-S/MTT-S for a hands-on technical session exploring high-speed interconnects and SerDes characterization using state-of-the-art test equipment. This seminar will feature a live demo on the Rohde & Schwarz ZNA 110 GHz VNA with Samtec Inc’s 90 GHz BullsEye ISI Test Board, showcasing real-world measurement workflows for 224 Gbps systems.
They'll cover best practices in high-speed S-parameter measurements, calibration, fixture de-embedding, and how to correlate frequency and time-domain data for advanced system analysis. This is a great opportunity for engineers and researchers in RF, microwave, packaging, and high-speed digital design to gain practical insights into the tools and techniques driving the future of 6G and beyond.
Amateur Radio Workshop
Date: May 27th, 2025
Time: 3:00 PM to 4:30 PM (EDT)
Location: Hub350, 350 Legget Dr, Kanata, ON K2K 3N1
The IEEE AP-S/MTT-S Joint Chapter in collaboration with the IEEE Signal Processing Chapter are organizing an Amateur Radio Workshop on May 27th at 3:00pm at Hub350. It is an interesting hobby that provides participants with an unlimited opportunity to explore science and technology in fun ways while making friends and getting involved in club activities and community events.
You will hear from members of the Ottawa Amateur Radio Club about how to get your Amateur Radio License and see some of the technologies they build and use. Learn more about the club activities and community events that they support.
You will have an opportunity to get “Hands-on” during this session.
How Close can Far-Field Be? Getting the Best Out of Your Measurement Range
Date: June 3rd, 2025
Time: 12:00 PM to 1:30 PM (EDT)
Location: Hub350, 350 Legget Dr, Kanata, ON K2K 3N1
Trends in modern wireless communications, including the use of massive MIMO and millimeter-wave frequencies, have supported an increased deployment of electrically large antennas. This created technical and economic challenges as many EMC or regulatory tests require a far-field condition. This talk provides an overview of the recent findings in defining the shortest possible far-field test distance, depending on the size of the device under test, its operation frequency, the target metric and the upper bound acceptable measurement deviation.
Practical ways are also described to determine the maximum antenna aperture size that can be tested in the far-field at a given frequency and for a maximum error, in an existing chamber with a defined range length.
Speaker Bio
Benoit Derat received the Engineering degree from SUPELEC, in 2002, and the Ph.D. degree (Hons.) in physics from the University of Paris XI, in 2006. From 2002 to 2008, he worked at SAGEM Mobiles, as an Antenna Design and Electromagnetics Research Engineer. In 2009, he founded ART-Fi, which created the first vector-array specific absorption rate measurement system. He operated as the CEO and the President of ART-Fi, before joining Rohde & Schwarz, Munich, in 2017. He is currently the Senior Director of Engineering for Vector Network Analyzers, Electromagnetic Compatibility, Over-The-Air and Antenna Test applications. Dr. Derat is a Senior Member of the Antenna Measurement Techniques Association (AMTA) and a Distinguished Lecturer of the IEEE EMC Society (2024 – 2025). He is the author of more than 80 scientific journals and conference papers, and an inventor on more than 40 patents, with main focus in antenna systems near and far-field characterization techniques.
With the advent of smart products, we are surrounded by wireless devices communicating via different technologies, like Bluetooth, Wi-Fi, LTE, 5G, etc. When designing such products, it is important to test their performance inside different indoor and outdoor environments, for both coverage and interference. WinProp offers highly accurate and fast propagation models for almost every standard technology. This presentation will give an overview of WinProp capabilities for wireless network coverage analysis, with live demonstrations.
Presented by the IEEE Communications Society:
IEEE ComSoc Student and Young Professionals Career Fair at ICC 2025
The IEEE Communications Society is hosting a Career fair at the IEEE International Conference on Communications ICC 2025 in Montreal on 10th June 2025. The event is FREE for students and Young Professionals.
Participating companies will provide sessions on important professional skills you need to kickstart your future while learning more about each company. Don't miss the opportunity to get invaluable career advice to kickstart your future!
Presented by the IEEE AP-S/MTT-S Ottawa Section Jt. Chapter:
IEEE AP-S News
On May 1st, IEEE Ottawa hosted a highly engaging seminar on Co-Packaged Optics – 3D Heterogeneous Integration of Photonic IC and Electronic IC, presented by Dr. John Lau, a world-renowned expert in advanced packaging. Held at Hub350, the event drew a full house of professionals and students from across the Kanata tech community. Dr. Lau delivered an insightful talk covering cutting-edge trends in co-packaging, integration challenges, and the future of photonic-electronic convergence.
Presented by the IEEE Ottawa Robotics Competition 2025:
Call for volunteers for IEEE Ottawa Robotics Competition 2025!
The Ottawa Robotics Competition is back with its 22nd year of competition on May 25th at All Saints High School. The organizing team is looking for volunteers for a variety of competition day roles including setup, refereeing competitions, judging interviews and data entry!
