Events
Arduinos, 3D printing, Lego Mindstorms and displays, submarine
robots, and AI, where can you find all this? All of this and MUCH MORE will be at the IEEE Ottawa Robotics
Competition (ORC), Ottawa’s largest robotics competition for grade 5 to 12
students. The ORC is taking place on Sunday,
June 2nd at Earl of March
Secondary School. Best times to show up are between 10:30 am to 12:30 pm and 1:30 pm to 4 pm. The ORC is completely
open to the public, so invite your friends and family too!
Check out previous competitions at https://youtube.com/user/ieeeorc/videos.
If you have any questions, please feel free to email us at orcinfo@ieeeottawa.ca.
Fields-CQAM Public Lectures: Ali Ghodsi, University of Waterloo
What is missing from common practice in machine learning?
AI, and machine learning in particular, is enjoying its golden age. Machine learning has changed the face of the world over the past two decades but we are still a long way from achieving a general artificial intelligence. In this talk, I will discuss a couple of elements that I believe are missing from common practice in machine learning, including incorporating causality and creating a new framework for unsupervised learning.
Biography
Ali Ghodsi is a Professor in the Department of Statistics and Actuarial Science at the University of Waterloo. His research involves statistical machine-learning methods. Ghodsi’s research spans a variety of areas in computational statistics. He studies theoretical frameworks and develops new machine learning algorithms for analyzing large-scale data sets, with applications to bioinformatics, data mining, pattern recognition, robotics, computer vision, and sequential decision making.
DATE:
THURSDAY, JUNE 20TH, 2019.
PRESENTATION
6:00 PM – 7:00 PM.
NETWORKING
7:00 PM – 8:00 PM.
LOCATION
HEALTH SCIENCE BUILDING, RM. 1301 (LOCATED ON THE GROUND FLOOR), CARLETON UNIVERSITY.
FREE ADMISSION FOR THIS PUBLIC LECTURE.
PLEASE REGISTERÂ HERE.
8:30 am – 9:00 am | Registration | ||
---|---|---|---|
9:00 am – 9:15 am | Opening Remarks | Rafik Goubran | Carleton University |
9:15 am – 10:00 am | Keynote Presentation:
Data Mining and Machine Learning for Authorship and Malware Analyses |
Benjamin C. M. Fung Biography |
McGill University |
10:00 am – 10:30 am | Break | ||
10:30 am – 11:45 am | Cybersecurity: Top 5 class imbalance ML challenges and data sets Abstract |
Stephan Jou Biography |
Interset |
Class Imbalance in Fraud Detection Abstract |
Robin Grosset Biography |
MindBridge Analytics Inc. | |
Handling class imbalance in natural language processing Abstract |
Isuru Gunasekara Biography |
IMRSV Data Labs | |
11:45 am – 12:45 pm | Lunch | ||
12:30 pm – 2:10 pm | Adaptive learning with class imbalanced streams Abstract |
Herna L. Viktor Biography |
University of Ottawa |
Radar-based fall monitoring using deep learning Abstract |
Hamidreza Sadreazami Biography |
McGill University | |
Privacy-preserving data augmentation in medical text analysis Abstract |
Isar Nejadgholi Biography |
National Research Council | |
Failure modelling of a propulsion subsystem: unsupervised and semi-supervised approaches to anomaly detection Abstract |
Julio J. Valdés Biography |
National Research Council | |
2:10 pm – 2:25 pm | Break | ||
2:25 pm – 3:40 pm | TBD | Reddy Nellipudi | DB Schenker |
AuditMap.ai: Hierarchical Sentence Classification in Unstructured Audit Reports Abstract |
Daniel Shapiro Biography |
Lemay.ai | |
Deep Learning techniques for unsupervised anomaly detection Abstract |
Dušan Sovilj Biography |
RANK Software Inc. | |
3:40 pm – 3:50 pm | Closing Remarks |
Speaker 1: Hisham Abed, P.Eng., Ericsson
Topic:Â Power Integrity – Best design practices
Speaker 2: Dr. Ihsan Erdin, Celestica
Topic:Â Power Integrity Optimization amidst MLCC shortage
Parking:Â Free
Registration: Free, and is on a first to reply basis. Preference given to IEEE EMC and CPMT society members. Seating is limited. E-mail reservation is required.
Pizza and soft drinks will be served.
Organizer: Dr. Syed Bokhari, Chairman, IEEE Ottawa
EMC chapter
Syed.Bokhari@fidus.com,
Office :(613) 595 – 0507 Ext. 377, Cell: (613) 355 – 6632
Directions:Â Â Â www.fidus.com
IEEE Ottawa Section: MTT-S / AP-S Chapter presents:
Title: Characterization and Modeling of GaN HEMT Trapping Effects for Microwave Circuit Design
Date: September 2nd, 2020
Time: 11 AM (ET)
Register at: https://events.vtools.ieee.org/m/238482
This talk will review some recent advancements achieved on the characterization and modelling of the trapping effects felt in GaN HEMT transistors, and their impact on microwave circuit design. Because of their nowadays importance, a particular attention will be payed to applications on high power amplifiers for mobile wireless infrastructure and pulsed radar applications.
For that, the talk will start by recollecting the most common model formulations adopted for the various levels of RF engineering, from the device level (physics) to the transistor (circuit) and amplifier (system) level. Starting by the Shockley-Read-Hall capture and emission processes we will be able to understand one of the fundamental signatures of trapping effects, the significantly different charge and discharging time constants, and its impact on power amplifier nonlinear distortion behavior. Then, some widely adopted approaches of the channel current transients’ characterization are addressed and the talk concludes by presenting some illustrative cases of application to RF high power amplifiers.
Speaker: Jose C. Pedro
José C. Pedro received the Diploma, Ph.D., and Habilitation degrees in electronics and telecommunications engineering from the Universidade de Aveiro, Aveiro, Portugal, in 1985, 1993, and 2002, respectively.
He is currently a Full Professor with the Universidade de Aveiro and head of the Aveiro site of the Instituto de Telecomunicações. He has authored 2 books and authored or co-authored more than 200 papers in international journals and symposia. His current research interests include active device modelling and the analysis and design of various nonlinear microwave circuits.
Dr. Pedro was a recipient of various prizes including the 1993 Marconi Young Scientist Award, the 2000 Institution of Electrical Engineers Measurement Prize, the 2015 EuMC Best Paper Microwave Prize, and the Microwave Distinguished Educator Award. He has served the scientific community as a Reviewer and an Editor for several conferences and journals, namely, the IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, for which he was the Editor-in-Chief.