Events

Jul
17
Wed
An Evening with Power Integrity Experts @ Fidus Systems, Ottawa
Jul 17 @ 17:00 – 19:30

Speaker 1: Hisham Abed, P.Eng., Ericsson

Topic: Power Integrity – Best design practices

Speaker 2: Dr. Ihsan Erdin, Celestica

Topic: Power Integrity Optimization amidst MLCC shortage

Parking: Free

Registration:  Free, and is on a first to reply basis. Preference given to IEEE EMC and CPMT society members. Seating is limited. E-mail reservation is required.

Pizza and soft drinks will be served.

Organizer: Dr. Syed Bokhari, Chairman, IEEE Ottawa
EMC chapter

Syed.Bokhari@fidus.com,

Office :(613) 595 – 0507 Ext. 377, Cell: (613) 355 – 6632

 

Directions:    www.fidus.com

Oct
22
Tue
The Lightning Phenomenon @ 4124-ME (Meckenzie Building), Carleton University
Oct 22 @ 12:00 – 13:00

IEEE  Distinguished Lecturer Presentation hosted jointly by the IEEE Ottawa EMC and CASS/SSCS/EDS Chapters:

 

Speaker  :     Dr. Marcos Rubinstein, Professor, University of Applied Sciences of Western Switzerland

Topic    :     The Lightning Phenomenon

Date     :     Tuesday October 22, 2019

Time     :     12(noon) – 1pm

Location :     4124-ME (Meckenzie Building), Carleton University, 1125 Colonel By Drive, Ottawa – K1S5B6

 

Registration:  Free, Please E-mail Ram Achar (achar@doe.carleton.ca)

Refreshments: Served

 

Parking  : Payment based Metered Parking spots in the campus

 

Organizers:

               Ram Achar, Dept. of Electronics, Carleton University

               Chairman CASS/SSCS/EDS Chapters

               achar@doe.carleton.ca

               Dr. Syed Bokhari, Chairman, IEEE Ottawa EMC chapter

 

Abstract

Lightning is one of the primary causes of damage and malfunction of telecommunication and power networks and one of the leading causes of weather-related deaths and injuries.

Lightning is composed of numerous physical processes, of which only a few are visible to the naked eye.

This lecture presents various aspects of the lightning phenomenon, its main processes and the technologies that have been developed to assess the parameters that are important for engineering and scientific applications. These parameters include the channel-base current and its associated electromagnetic fields.

The measurement techniques for these parameters are intrinsically difficult due to the randomness of the phenomenon and to the harsh electromagnetic environment created by the lightning itself.

Besides the measurement of the lightning parameters, warning and insurance applications require the real-time detection and location of the lightning strike point. The main classical and emerging lightning detection and location techniques, including those used in currently available commercial lightning location systems will be described in the lecture. The newly proposed Electromagnetic Time Reversal technique, which has the potential to revolutionize lightning location will also be presented.

 

Biography

Marcos Rubinstein received the Master’s and Ph.D. degrees in electrical engineering from the University of Florida, Gainesville.

In the decade of the 1990’s, he worked as a research engineer at the Swiss Federal Institute of Technology, Lausanne and as a program manager at Swisscom in the areas of electromagnetic compatibility and lightning. Since 2001, he is a professor at the University of Applied Sciences of Western Switzerland HES-SO, Yverdon-les-Bains, where he is currently responsible for the advanced Communication Technologies Group. He is the author or coauthor of 300 scientific publications in reviewed journals and international conferences. He is also the coauthor of nine book chapters and the co-editor of a book on time reversal. He served as the Editor-in-Chief of the Open Atmospheric Science Journal, and currently serves as an Associate Editor of the IEEE Transactions on EMC.

Prof. Rubinstein received the best Master’s Thesis award from the University of Florida, the IEEE achievement award and he is a co-recipient of the NASA’s Recognition for Innovative Technological Work award. He also received the ICLP Karl Berger award. He is a Fellow of the IEEE and an EMP Fellow, a member of the Swiss Academy of Sciences and of the International Union of Radio Science.

Nov
12
Tue
5G for Smart Everything: From Smart Meters to the New Power Grid. What is needed to get there? @ Building M-36, National Research Council (NRC) Canada
Nov 12 @ 14:00 – 15:00

Title: 5G for Smart Everything: From Smart Meters to the New Power Grid. What is needed to get there ?

Speaker: Akshay Sharma, Executive Research Fellow, neXtCurve: www.next-curve.com

Date/TimeTuesday, November 12, 2019, from 2 – 3 pm.

Admission: Free, but registration is required for security purposes. Please contact by e-mail: branislav @ieee.org or ajit.pardasani@ieee.org.

 

Abstract: This talk discusses how 5G with Edge Computing, and Ultra-low latency (sub-5ms) with Gigabit speed bandwidth will be a game changer with Smart Meters and a new Electric Grid can be enabled with Smart Lamposts. As we transition to DevOps, AIOps, newer Closed Loop Automation systems will occur. As we connect AI-powered Virtual Personal Assistants to IoT devices in the home, now we have to imagine the entire macro-infrastructures being all hyper-connected. What is needed to get there will be discussed at the seminar.

 

Speaker’s Bio: Akshay Sharma is originally from Ottawa, B. Eng Computer Systems Engineering from Carleton, a tech analyst, formerly from Gartner, having authored or co-authored over 280 research notes, on emerging technologies like SD-WAN, 5G, mobile video, cloud CDN, IoT, etc. in the past decade. A frequent speaker at tech events, he is often quoted in leading institutions like CNN, Wall St. Journal, etc. He is a former CTO of one of the first video/WiFi smartphone firms, former Chief Architect at Siemens Mobile, and has been given awards by the NJ IEEE Chapter on talks he gave on 5G and Cybersecurity. He is on the tech advisory board for 5G and DevOps startups: LB-N, Kovair, along with others. Mr Sharma’s recent publications include: Search Results for “akshay” – neXt Curve

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