Technical Talk: Improve Measurement Accuracy on Switching Characteristics of SiC and GaN devices
1385 Woodroffe Ave.
- Refreshments, Registration and Networking: 18:00
- Seminar: 18:30 – 20:00.
PARKING: Parking in Lots 8 and 9 after 5 p.m. is $5 flat rate, pay at a machine and display the
ticket on your dashboard.
This presentation highlights the industry best practices for measurements on modern
power electronics devices such as SiC and GAN devices. These modern devices introduce new
complexities into power conversion circuits requiring the need for precise circuit timing and higher
sensitivity for gate threshold voltage and timing.
Common measurement pitfalls can be avoided by using differential and floating measurements and
understanding the link between CMRR and signal frequency. Today’s power designs can have
common mode voltages in excess of hundreds or even thousands of volts, while still needing to
measure small differential voltages, this common mode error can be even more severe. Wide
bandgap devices allow switching of higher frequencies, higher voltages and faster rise times, which
requires higher bandwidth scopes and probes with high CMRR. In this presentation, some solutions
for improving the measurement accuracy on SiC and GaN devices during switching will be
Evan Shuster is presently the Director of Sales at Testforce Systems Inc. Testforce is North
America’s largest Representative of premium test equipment. Evan has thirty years of Test and
Measurement experience. Originally from Montreal, with a career start at Bell Canada, Evan has held
directorial positions at several small to mid-sized companies in Canada and the United States. Evan
has built up hugely successful Technical Account Manager teams with market focus covering
Semiconductors, Power and Wireless Technologies to name a few. Evan has previously created and
delivered Technical Training courses and has been a guest lecturer at several Universities and
Colleges across Canada.